Allows to measure the microhardness of both hard and soft materials. This analysis makes it possible to evaluate the quality of materials surface and reinforced layers, and to determine the thickness of the surface coating of certain materials
Hardness Tester МНV 1000
Automated stationary microhardness tester MNV 1000 is designed for measuring both hard and soft materials according to the Vickers scale at applied force from 10 to 1000 gf, automatic loading, dwell time from 5 to 60 s and unloading. Measurement is carried out manually at a magnification of 400X. Resulting indent is photographed, measured and converted to microhardness automatically.
The analysis is performed according to DSTU ISO6507-1-2007, DSTU ISO 3887-2009, ISO 4507 2000, ISO 18203 2016, DSTU EN ISO 4498:2014 and other.
- Microhardness testing according to the Vickers scale
- Determination of the depth of decarburization of steels
- Determination of thickness of strengthened surface layers by measuring the microhardness of sintered, cemented or nitrated iron materials
- Determination of thickness of strengthened surface layers (nitrated layer) in steels.
- Determination of apparent hardness and microhardness of sintered metallic materials.
- Determination of microhardness of hard alloys, ceramics and solder joints.
Allows to identify the phase composition of materials and their transformations at different temperatures. With the help of the software, it is possible to measure the texture, internal stress in the material and the percentage of amorphous phases; the size of crystals in nanomaterials.
Diffractometer Rigaku UltimaIV
- Determination of phase composition (phase identification), structural characteristics and their changes
Investigation of phase and structural transformations
Precise determination of lattice parameters
Analysis of crystallographic defects
Analysis of size distributions in nanomaterials
Analysis of internal stresses and texture
Determination of thermal stability of the material
Allows you to observe on the screen and photograph (digital recording) images of objects in a wide range of magnifications, get diffraction patterns, explore objects with their inclination and rotation using a goniometric device.
Transmission electron microscope PEM-U
- Microstructural investigations of thin foil and thin film materials “upon transmission” in the ight and dark field imaging modes with an magnification of up to 10⁶ times and high resolution (up to 1 nm) with high localization (up to 1 micron and less)
- Determination of the sizes of dispersed particles, crystallites, and cells; study of the crystal structure defects (dislocations, stacking faults, twins, grain boundaries and triple points of grains)
- Study of the structure and phase composition of materials by electron diffraction method with the obtaining of electronograms
- Investigation of materials structure using replicas taken from the surface of bulk materials
- Morphological analysis of the elements of the received images
Allows direct measurement of the mass fractions (concentration) of chemical elements in metal alloys using non-destructive Energy Dispersive X-Ray Fluorescence spectroscopy (EDXRF) without the use of standards.
The model “EXPERT 3L” provides quantitative determination of elements from 12Mg to 92U in all types of alloys (both standard and non-standard) when performing majority metallurgical measurements: scrap metal sorting; quality control of the chemical composition of raw materials; operational control of the composition of the metal in the process of its smelting; final quality control of products, etc. In most cases, the accuracy and sensitivity of quantitative analysis with the help of “EXPERT 3L” are not inferior to traditionally used chemical and optically-emission methods of analysis within the requirements of GOST and DSTU.
- Range of elements sensitivity: from magnesium (12Mg) up to uranium (92U)
- Samples: bulk, homogenous alloys
- Minimum/maximum sample dimensions: from 3х3х1mm up to 100х100х60mm
- Maximum sample weight: 10 kg
- Testing timespan: 300-600 s
Allows to capture images of the surface of an object with high spatial resolution and high depth of field using backscattered (BSE) and secondary (SE) electrons, as well as information on chemical composition, structure, and other characteristics of near-surface layers. The technique is based upon the interactions of the electron beam with the investigated substance.
Scanning electron microscope REM-106I
- Obtaining an image of a surface of an object with high spatial resolution with a large depth of field (0.6-0.8 mm)
- Study of the microstructure of materials: metals, alloys, ceramics, composites, semiconductor materials
- Fractographic studies
- Establishment of qualitative and quantitative elemental (chemical) composition of investigated objects
- Obtaining the distribution profiles of the chemical composition in the analyzed objects
- Elements analyzed: from Mg (magnesium) to U (uranium)
Allows to solve a wide range of research tasks in the study of metallurgical samples and for routine quality control, for example, for the analysis of microstructures, testing of various materials and microphotography.
Metallurgical microscopes Meiji Techno IM-7000 and RZ series
- Obtaining a surface image of and object with high resolution under normal and polarised light
- Materials microstructure investigations: metals, alloys, ceramics, composites and semiconductors