Allows to capture images of the surface of an object with high spatial resolution and high depth of field using backscattered (BSE) and secondary (SE) electrons, as well as information on chemical composition, structure, and other characteristics of near-surface layers. The technique is based upon the interactions of the electron beam with the investigated substance.
Scanning electron microscope REM-106I
- Obtaining an image of a surface of an object with high spatial resolution with a large depth of field (0.6-0.8 mm)
- Study of the microstructure of materials: metals, alloys, ceramics, composites, semiconductor materials
- Fractographic studies
- Establishment of qualitative and quantitative elemental (chemical) composition of investigated objects
- Obtaining the distribution profiles of the chemical composition in the analyzed objects
- Elements analyzed: from Mg (magnesium) to U (uranium)